| 1 |
10:00~10:10 |
Welcome &
Opening the Conference |
Conference Chair |
|
| 2 |
10:10~11:00 |
Highly Reliable Semiconductor & Soft Error |
Jonathan A. Pellish
(NASA) |
Presentation Slide |
| 3 |
11:00~11:50 |
The Impact of C-ITS & Soft Error |
Kyeong-Pyo Kang,
Specialist of KOTI*
*Korea Transport Institute |
Presentation Slide |
| 4 |
11:50~13:20 |
Lunch & Lab tour |
| 5 |
13:20~13:50 |
Acceleratin Neutron Assessment Facility
Status & Trend in Korea |
Moohyun Cho,
Executive President of NINT*
*National Institute for Nanmaterials Technology |
Presentation Slide |
| 6 |
13:50~14:40 |
Single Event Effect Basics |
Raoul Velazco
(TIMA) |
|
| 7 |
14:40~15:00 |
Break |
| 8 |
15:00~15:50 |
Tests for Korean SEU R&D
& DRAM Soft Errors |
Sanghyeon Baeg, Prof.
(Hanyang University) |
Presentation Slide |
| 9 |
15:50~16:40 |
Current States of Soft Error
& Future Direction for R&D |
Sung Chung, CTO
(QRT Inc.) |
Presentation Slide |
| 10 |
16:40~17:00 |
Raffle and djournment |
