| Session Time |
Session Title |
Speaker |
Presentation |
10:00~10:10
(10min) |
Welcome and Opening the Conference |
10:10~11:00
(50min) |
Key Note:
The Influence of ISO26262 Standard (Revision) on
Semiconductor Industry |
Joongsik Kih, Doctor
(QRT Inc.) |
Presentation Slide |
11:00~11:50
(50min) |
Session 1:
European Assesment Facility and Research Trend |
Hoon-Kyu Shin, Professor
(POSTECH) |
Presentation Slide |
11:50~13:00
(70min) |
Lunch & Lab Tour |
13:00~13:50
(50min) |
Session 2:
FINFET Circuit Design with Resistance to SET For
TID Analysis & Physical Modeling of Ionized Current
|
Ji-Woon Yang, Professor
(Korea University)
|
Presentation Slide |
13:50~14:40
(50min) |
Session 3:
Evaluation Report and Data Analysis for Soft Error |
Woo Joon Lee,
Research Engineer
(Korea Aerospace Research Institute)
|
Presentation Slide |
14:40~15:00
(20min) |
Break |
15:00~15:50
(50min) |
Session 4:
Evaluation Report and Data Analysis for Soft Error |
Sung Chung, CTO
(QRT Inc.) |
Presentation Slide |
15:50~16:00
(10min) |
Raffle and Adjournment |
