Program Schedule

Session Time	Session Title		Speaker	Presentation
10:30~10:40 (10min)	Welcome and Opening the Conference
10:40~11:20 (40min)	S1Device for Space and Automotive	Device Degradation due to Radiation on Silicon Transistors	Jungsik Kim, PhD (Gyeongsang National University, Korea)	Presentation Slide Video Presentation
11:20~12:00 (40min)		The Importance of Reliability Evaluation and Radiation Test of Satellite Control System	Hosang Yi (APSI, Korea)	Presentation Slide Video Presentation
12:00~13:00 (60min)	Lunch
13:00~ 13:40 (40min)	S2Automotive Application : , Processor, Storage and Power Device	Functional Safety and Radiation Effects Considerations for AV Systems	Jyotika Athavale, PhD (nVidia, USA)	Presentation Slide Video Presentation
13:40~14:20 (40min)		Design Consideration for DRAM/SSD Automotive Functional Safety Application	Keith Kim (SK Hynix, USA)	Presentation Slide Video Presentation
14:20~15:00 (40min)		Power Semiconductor for Automotive Application : How safe is SOA(Safe Operation Area)?	Joongsik Kih, PhD (QRT, Korea)	Presentation Slide Video Presentation
15:00~15:20 (20min)	Break
15:20~16:00 (40min)	S3Device Radiation Test and Analysis	Los Alamos In-House Expert’s Guideline for Successful Accelerated Neutron Test	Steven Wender, PhD (LANSCE, USA)	Presentation Slide Video Presentation
16:00~16:40 (40min)		Soft Error Test for Fast Moving Automotive Industry	Sung Chung, CTO (QRT, Korea)	Presentation Slide Video Presentation
16:40~16:50 (10min)	Adjournment

The program maybe changed due to internal circumstances.