Robert Baumannrbaumann@radiositysolutions.com
Radiosity Solutions LLC
ABSTRACT :
Radiation effects often dominate reliability failures in microelectronics – this is especially true in the harsh radiation environment of space. As motivation, we start this talk with consideration of the impact of space radiation on a recent SpaceX constellation launch (80% of satellites were lost!). We take a high-level review of key aspects of dose and single-event effects [SEEs] coupled with a quick review of the harsh space environment, considering the two sources of radiation (galactic cosmic rays and solar radiation and events) and the modulation of that radiation by geomagnetic effects and orbital and mission parameters. Finally, we focus on aspects of accelerated testing for SEEs using proton and heavy ion accelerator facilities providing beams that mimic particles found in space. We close with a discussion of sample preparation requirements, ion selection considerations, and a basic example of how on-orbit SEE rates are calculated combining the experimentally determined device cross-section and the environmental model from a specific orbit to accurately access the reliability impact of SEEs
BIOGRAPHY :
Robert Baumann received a B.A. in Physics (cum laude) from Bowdoin College, Brunswick Maine, USA, and the Ph.D. in Electrical Engineering and Computer Science from Rice University, Houston Texas, USA.
Robert discovered that the reaction of 10B with low-energy cosmic neutrons in specific IC layers was a dominant reliability risk and developed mitigations directly reducing product failure rates ten-fold for TI and industry-wide. He also drove several radiation-effects breakthroughs in the industry (First web-based SEU reliability calculator, the concept and implementation of production ULA packaging flows, etc.). Robert was directly responsible for the development of several radiation test standards (JESD89, JESD89A, and JESD221), and negotiated with the U.S. Government to change ITAR export control laws - ultimately eliminating the risk of inadvertent restrictions on U.S. semiconductor companies. Robert was both an individual technical contributor and technical leader in various roles in the US and Japan during his 29 years at TI (retired as Chief Technologist and TI Fellow of HiRel Product Group in 2018).
Robert is currently dividing his time between consulting with a variety of space and terrestrial customers, and university research. From 2018 – 2022 he was an adjunct R&D professor at SMU where he created radiation effects capabilities and led reliability research on power GaN devices. He is now building the radiation effects characterization and modeling capabilities in the Center for Harsh Environment Semiconductors and Systems (CHESS) at University of Texas at Dallas (UTD). He has authored or coauthored 100+ papers / presentations, TI’s very popular “Radiation Handbook for Electronics”, two book chapters, and has 17 patents.
Insoo JunInsoo.Jun@jpl.nasa.gov
The Jet Propulsion Laboratory, California Institute of Technology
ABSTRACT :
Planning is underway at NASA for returning humans to the Moon, and later to Mars. Many countries around the world are also envisioning many robotic deep space missions. Every space mission is subjected to harsh environments in the operational space environment, whether it be electromagnetic radiation (e.g., solar UV/EUV and x-ray photons), low- and high-energy particle radiation (e.g., solar wind, solar energetic particles, galactic cosmic rays, and trapped particles in planetary magnetic fields), neutral particles (such as atomic oxygen and albedo neutrons), micrometeoroids and orbital debris (MMOD) or any combination of them. Even extreme variations in thermal environments and the vacuum of space can cause detrimental effects on spacecraft materials. Understanding the space environment and protecting human crews and spacecraft systems from mission-specific space environmental effects is a must to assure mission success. The former is a scientific endeavor while the latter is an engineering/technological task.
In particular, in this talk, the currently understood challenge related to space radiation for current/future missions will be presented and discussed – we will summarize a view on the state-of-the-art knowledge on the space radiation environments, present a community’s perspective on gaps in our understanding in the space radiation environments, and finally provide an impetus for discussions on possible future studies on space radiation.
BIOGRAPHY :
Dr. Insoo Jun received PhD in Nuclear Engineering (in the field of Applied Plasma Physics and Fusion Technology) from UCLA in 1991. After spending nine years in academia and industry, he joined JPL’s Mission Environments Group in 2000 as a senior technical staff. He has been the group supervisor of the same group, renamed Natural Space Environments group, from 2004 to 2011 and from 2014 to 2020. He serves as the Lead for JPL’s Center for Space Radiation and concurrently as the Section Chief Technologist and Deputy Technical Fellow for the NASA agency-wide Space Environment Technical Discipline Team (TDT).
His main expertise is in space radiation environments and effects on space systems and planetary bodies. He is currently leading many NASA-funded projects related to space radiation by performing research on nuclear planetary science and space physics. Furthermore, he serves as science team members for the MSL, Europa, Psyche missions, and Artemis Gateway HERMES.
Hae-Dong Kimhaedkim@gnu.ac.kr
Gyeongsang National University
ABSTRACT :
Professor Kim Hae-dong, who has been participating in the NanoSat Conference for many years, it will be the 8th Conference this year. He will talk about detailed development status of the current and recent development of NanoSat technology in Korea and the world.
Details abstract will be updated soon.
BIOGRAPHY :
Professor Kim Hae-dong is a Ph.D. in engineering and is currently majoring in space engineering at the Department of Aerospace and Software Engineering at the College of Engineering at Gyeongsang National University. He graduated from the Department of Aeronautics at KAIST (Korea Advanced Institute of Science and Technology) and was appointed as a full professor in August of last year. While working at the Korea Aerospace Research Institute since 2000, Dr. Kim received his Ph.D. under Professor Bang Hyo Chung.
In 1996, Dr. Kim participated in the development of the control system for Arirang Satellite 1 through 5, Korea's first practical satellite, from Hyundai Aerospace and Aviation. Also, microsatellite development was carried out. While studying various space systems at Gyeongsang National University, Dr. Kim contributed to the training of professional space personnel based on his know-how and experience in research and development in the field of space for the past 28 years.
Detailed Bio will be updated soon.
Woojun Leelwj1026@kari.re.kr
Senior Researcher, KARI
ABSTRACT :
To use semiconductors in satellites, extreme space environments must be taken into consideration. This includes environments where the semiconductor is exposed to repetitive thermal cycles of low and high temperatures, as well as to radiation with high energy particles. For instance, they will be exposed to repeated cycles of low and high temperatures, as well as strong radiation with high energy. Additionally, due to the inability to replace or repair components, high reliability and lifespan must be ensured.
To introduce the latest technology into space-grade semiconductors, verification of extreme environmental and radiation characteristics must be completed, followed by a qualification process. For these reasons, the introduction of the latest technology into space-grade semiconductors is slower compared to commercial semiconductors. In this lecture, we will discuss the latest trends in the development of new technologies for space-grade semiconductors.
Next, we will introduce the single event effect testing method for space-grade semiconductors. We will also explain the difficulties encountered during the single event effect radiation testing, depending on the structure of the space-grade semiconductor.
BIOGRAPHY :
Woojun Lee received his B.S. in Electronics Engineering from Sogang University, Seoul, Korea in 2009, and his M.S. in Electronics Engineering from the same university in 2011. From 2011 to 2014, he conducted research on DRAM devices at SK Hynix. Since 2015, he has been working at the Korea Aerospace Research Institute, where he is responsible for EEE part for satellite. In this role, he is currently conducting research on semiconductor reliability and radiation characteristics.
Robert Baumannrbaumann@radiositysolutions.com
Radiosity Solutions LLC
ABSTRACT :
Critical computational applications such as autonomous automobile and aircraft controls have significantly raised the bar on functional safety requirements for microelectronics. As motivation, we present two examples, where single-event effects (SEEs) were directly responsible for failures. First, we show SEEs upsetting caches of a flagship server at much higher rates than anticipated, thereby impacting reliability. Second, we show how a SEE in an aircraft flight computer caused an error precipitating a drastic altitude change that injured crew and passengers. We will review the three sources of radiation on the ground and in flight from the terrestrial environment: High-energy neutrons, thermal neutrons, and alpha particles. We then consider the types of failure modes and the test requirements to manage the various radiation effects along with some recommendations for specific testing to eliminate failure rate underestimates.
BIOGRAPHY :
Robert Baumann received a B.A. in Physics (cum laude) from Bowdoin College, Brunswick Maine, USA, and the Ph.D. in Electrical Engineering and Computer Science from Rice University, Houston Texas, USA.
Robert discovered that the reaction of 10B with low-energy cosmic neutrons in specific IC layers was a dominant reliability risk and developed mitigations directly reducing product failure rates ten-fold for TI and industry-wide. He also drove several radiation-effects breakthroughs in the industry (First web-based SEU reliability calculator, the concept and implementation of production ULA packaging flows, etc.). Robert was directly responsible for the development of several radiation test standards (JESD89, JESD89A, and JESD221), and negotiated with the U.S. Government to change ITAR export control laws - ultimately eliminating the risk of inadvertent restrictions on U.S. semiconductor companies. Robert was both an individual technical contributor and technical leader in various roles in the US and Japan during his 29 years at TI (retired as Chief Technologist and TI Fellow of HiRel Product Group in 2018).
Robert is currently dividing his time between consulting with a variety of space and terrestrial customers, and university research. From 2018 – 2022 he was an adjunct R&D professor at SMU where he created radiation effects capabilities and led reliability research on power GaN devices. He is now building the radiation effects characterization and modeling capabilities in the Center for Harsh Environment Semiconductors and Systems (CHESS) at University of Texas at Dallas (UTD). He has authored or coauthored 100+ papers/presentations, TI’s Radiation Handbook for Electronics, two book chapters, and has 17 patents.
Maria Kastriotomaria.kastriotou@stfc.ac.uk
ISIS Neutron and Muon Source, STFC Rutherford Appleton Laboratory
ABSTRACT :
RADNEXT facilities in ISIS has following facilities for Microelectronics accelerated radiation test.
a. ChipIR–neutrons: Atmospheric-like spectrum up to 800 MeV Facility designed for electronics testing,
b. EMMA –thermal neutrons: average energy of ~ 25 meV. Shared facility with STFC detector group,
c. C.RAL-RIKEN -muons: momentum up to 60 MeV/c
Details of the presentation abstract will be updated soon.
BIOGRAPHY :
I received my Ph.D. degree in physics from the University of Liverpool, in 2019. I have worked at CERN for seven years, mainly on the fields of beam instrumentation and diagnostics, and radiation effects on electronics. I have an extensive experience in radiation measurements, and in working at different accelerators and experimental facilities. In 2019 I joined the Rutherford Appleton Laboratory (UK), where I am responsible for the ChipIr instrument. ChipIr provides a neutron beam, which mimics the atmospheric spectrum and has been designed principally for the testing of Single Event Effects in microelectronics.
Selected publications:
• Measurements of ultra-high energy lead ions using silicon and diamond detectors, C.Cazzaniga, M. Kastriotou et al., Nucl.Instrum.Meth.A 985 (2021), DOI: 10.1016/j.nima.2020.164831
• SEE testing in ultra-high energy heavy ion beams, M. Kastriotou et al., IEEE Trans.Nucl.Sci. 67 (2019) 1, 63-70, DOI: 10.1109/TNS.2019.2961801
• SEE Tests With Ultra Energetic Xe Ion Beam in the CHARM Facility at CERN, P.Fernandez Martinez, M. Kastriotou et al., IEEE Trans.Nucl.Sci. 66 (2019) 7, 1523-1531, DOI: 10.1109/TNS.2019.2907112
• An Optical Fibre BLM System at the Australian Synchrotron Light Source, M. Kastriotou et al., Proceedings, International Beam Instrumentation Conference 2016 (IBIC2016), Barcelona, Spain, DOI: 10.18429/JACoW-IBIC2016-WEPG20
Kiseog Kim, Ph.D.kiseog.kim@qrtkr.com
Head of R&D, QRT Inc.
ABSTRACT :
Cosmic radiation causes serious damage to electronics, including semiconductors, but fortunately, the atmosphere surrounding the earth effectively shields this cosmic radiation.
However, neutrons increase due to proton collisions with the atmosphere, and upsetting electronic component caused by neutrons is becoming an issue. With the rapid spreading of electric vehicles and the wide use of semiconductors in automobiles is increasing, with the expansion of autonomous driving, the reliability of semiconductors in automobiles is directly related to life, and ISO 26262 functional safety standard mandates the evaluation of error rate caused by radiation for the semiconductors in automotives.
The evaluation of errors in semiconductor due to radiation must be performed at beam accelerator facilities, but accelerator facilities are scattered all over the world and each facility has different beam characteristics, so the standardized evaluation method or system that can compensate for these differences is required.
In this presentation, we will look at the challenges of estimating error rate in the semiconductors device during the radiation test and discuss various techniques to address these challenging issues.
BIOGRAPHY :
Dr. Ki-Seok Kim received his PhD in Physics from Yonsei University in 1996. After that, he developed various Flash Memory products for 22 years at Hynix. During the development of Flash Memory products, as a general manager who not only developed unit devices but also developed representative high-tech products, he managed efficiently by utilizing the entire development infrastructure such as devices, design, process, and test to complete the mission.
Since 2018, he has overseen R&D at QRT. QRT is a company specialized in reliability test equipment development as well as evaluation and comprehensive analysis of semiconductor and electronic product reliability. Dr. Kim is developing systems that meet the new reliability evaluation requirements of semiconductors, such as soft error evaluation system and RF product life evaluation system.
Saqib Ali Khan. Ph.D.Saqib@qrtkr.com
QRT Inc
ABSTRACT :
Radiation testing of semiconductor devices is an essential in validating their susceptibility and tolerance in natural as well as man-made radiation environments, such as terrestrial space, nuclear reactors, and particle accelerators. Pulsed laser testing is a widely used technique for characterizing the radiation response of semiconductor devices due to its ability to simulate the effects of ionizing radiation. It is an extremely powerful complimentary technique to facilitate performing quick screening and hardness validation. Modern semiconductor devices tend to be very complex and exhibit new failure phenomenon. Using femtosecond lasers, it is not only possible to reproduce such rate failure but also precisely localize them on the die.
The talk would cover the scope of radiation testing using pulsed laser techniques and its application in assessing the radiation hardness of modern semiconductor devices. The talk also highlights the challenges associated with pulsed laser testing. Numerous application examples on various types of memory, power and analogue devices using femtosecond would be features of this talk.
BIOGRAPHY :
Saqib Ali Khan received his B.Sc. in Computer Engineering from COMSATS University, Pakistan in 2006, and M.Sc. Degree in Electrical Engineering from Mid Sweden University, Sweden, in 2008, and Ph.D. degree in Electronics and Communication Engineering from Hanyang University, Republic of Korea, in 2017. His doctorate research focused on alpha particle-induced Single Event Effects (SEE) testing methods.
After working for several years in academia, he joined QRT Inc. in 2019 as Senior Radiation Effects Engineer. His main expertise includes radiation effects characterization, radiation environment modeling and Monte Carlo simulation. He has vast experience of conducting SEE and Total Ionizing Dose (TID) testing and characterization on a variety of semiconductor devices, e.g., SRAMs, DRAMs, SSDs, Power, and Analog devices for terrestrial and space applications.
He is currently working on femtosecond Pulsed-laser-based SEE evaluation and characterization methods for advanced semiconductor devices.
- Session 1-1 :
SEE TESTING REQUIREMENTS FOR MICROELECTRONICS IN SPACE APPLICATIONS -
Robert Baumann
rbaumann@radiositysolutions.com
Radiosity Solutions LLC- Detail
- Session 1-2 :
SPACE RADIATION CHALLENGES FOR DEEP SPACE MISSIONS IN THE ARTEMIS ERA: MOON TO MARS -
Insoo Jun
Insoo.Jun@jpl.nasa.gov
The Jet Propulsion Laboratory, California Institute of Technology- Detail
- Session 1-3 :
KOREA NANO NANOCUBE DEVELOPMENT STA -
Hae-Dong Kim
haedkim@gnu.ac.kr
Gyeongsang National University- Detail
- Session 1-4 :
RECENT TRENDS IN THE DEVELOPMENT OF SPACE-GRADE SEMICONDUCTORS AND SINGLE EVENT EFFECT TESTING -
Woojun Lee
lwj1026@kari.re.kr
Senior Researcher, KARI- Detail
- Session 2-1:
SEE TESTING REQUIREMENTS FOR MICROELECTRONICS IN TERRESTRIAL APPLICATIONS -
Robert Baumann
rbaumann@radiositysolutions.com
Radiosity Solutions LLC- Detail
- Session 2-2 :
CHALLENGES AND IMPROVEMENTS IN ACCELERATED RADIATION TESTING -
Kiseog Kim, Ph.D.
kiseog.kim@qrtkr.com
Head of R&D, QRT Inc.- Detail
- Session 2-3 :
RADIATION EFFECTS CHARACTERIZATION AND TOLERANCE TESTING OF SEMICONDUCTOR DEVICES USING FEMTOSECOND PULSED LASER SYSTEMS -
Saqib Ali Khan. Ph.D.
*Saqib@qrtkr.com
QRT Inc- Detail
